Focal-Plane Image and Beam Quality Sensors for Adaptive Optics

Marc Cohen, Gert Cauwenberghs, Mikhail Vorontsov and Gary Carhart

To appear at 19th Conference on Advanced Research in VLSI (ARVLSI01), Salt Lake City, UT, 14-16 March 2001


Abstract

Control of adaptive optical elements for real-time wavefront phase distortion compensation is a rapidly growing field of research and technology development. Custom VLSI controllers and sensors are a good match to the requirements of high resolution, real-time adaptive optical systems. Crucial to adaptively correcting the wavefront is a performance metric that can be directly evaluated from the acquired image or received laser beam, to provide real-time feedback to the controller adapting the wavefront. In this paper we introduce two VLSI focal-plane sensors that supply image and beam quality metrics to an adaptive controller that performs stochastic parallel perturbative gradient descent on a spatial phase modulator in the control loop. For imaging applications, we designed an image quality metric chip that reports the high spatial frequency energy content of the received image. For laser communications applications, we designed a beam variance metric chip that calculates the compactness of the transmitted or received beam as well as its centroid location. Both sensor chips are fully functional and the beam variance metric chip has been used in the feedback loop of an adaptive optics laser receiver experiment.


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